DC and low a frequency noise analysis of p channel gate all around vertically stacked silicon nanosheets

Cretu, B.B.CretuVeloso, AnabelaAnabelaVelosoSimoen, EddyEddySimoen2022-11-172022-10-302022-11-1720220038-1101WOS:000868453300006https://imec-publications.be/handle/20.500.12860/40657DC and low a frequency noise analysis of p channel gate all around vertically stacked silicon nanosheetsJournal article10.1016/j.sse.2022.108360WOS:000868453300006ELECTRICAL NOISE1/F NOISEEXTRACTIONMOSFETS