The role of grain boundary structure on electromigration-induced drift in pure Al and Al(0.5wt% Cu)

Proost, JorisJorisProostSamajdar, I.I.SamajdarVerlinden, B.B.VerlindenVan Houtte, P.P.Van HoutteMaex, KarenKarenMaexDelaey, L.L.Delaey2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/2886The role of grain boundary structure on electromigration-induced drift in pure Al and Al(0.5wt% Cu)Journal article