Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperature

Moonen, R.R.MoonenVanmeerbeek, P.P.VanmeerbeekLekens, GeertGeertLekensDe Ceuninck, WardWardDe CeuninckMoens, P.P.MoensBoutsen, J.J.Boutsen2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12593Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperatureProceedings paper