NBTI related time-dependent variability of mobility and threshold voltage in pMOSFETs and their impact on circuit performance

Ayala, N.N.AyalaMartin-Martinez, J.J.Martin-MartinezAmat, E.E.AmatBargallo Gonzalez, MireiaMireiaBargallo GonzalezVerheyen, PeterPeterVerheyenRodriguez, R.R.RodriguezNafria, M.M.NafriaSimoen, EddyEddySimoen2021-10-192021-10-1920110167-9317https://imec-publications.be/handle/20.500.12860/18506NBTI related time-dependent variability of mobility and threshold voltage in pMOSFETs and their impact on circuit performanceJournal article