Fluctuation scaling in nano-interconnects and its application to electromigration

Beyne, SofieSofieBeyneBeyne, TimTimBeyne2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/32535Fluctuation scaling in nano-interconnects and its application to electromigrationMeeting abstracthttps://infoscience.epfl.ch/record/269229?ln=en