Samara, VladimirVladimirSamaraBrouri, MohandMohandBrouride Marneffe, Jean-FrancoisJean-Francoisde MarneffeMilenin, AlexeyAlexeyMileninBoullart, WernerWernerBoullart2021-10-192021-10-192011-11https://imec-publications.be/handle/20.500.12860/19722Resistance and capacitance measurements of the films deposited on a planar Langmuir probeProceedings paper