A reliable metric for mobility extraction of short channel MOSFETs

Severi, SimoneSimoneSeveriPantisano, LuigiLuigiPantisanoAugendre, EmmanuelEmmanuelAugendreSan Andres Serrano, EnriqueEnriqueSan Andres SerranoEyben, PierrePierreEybenDe Meyer, KristinKristinDe Meyer2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12879A reliable metric for mobility extraction of short channel MOSFETsJournal article