Shimura, YosukeYosukeShimuraWang, WeiWeiWangNieddu, ThomasThomasNiedduGencarelli, FedericaFedericaGencarelliVincent, BenjaminBenjaminVincentLaha, PriyaPriyaLahaTerryn, HermanHermanTerrynStefanov, StefanStefanStefanovChiussi, StefanoStefanoChiussiVan Campenhout, JorisJorisVan CampenhoutNguyen, Ngoc DuyNgoc DuyNguyenVantomme, AndreAndreVantommeLoo, RogerRogerLoo2021-10-212021-10-212013-06https://imec-publications.be/handle/20.500.12860/23079Bandgap measurement by spectroscopic ellipsometry for strained Ge 1-x Sn xProceedings paper