Hsu, BrentBrentHsuSimoen, EddyEddySimoenLin, DennisDennisLinStesmans, AndreAndreStesmansGoux, LudovicLudovicGouxDelhougne, RomainRomainDelhougneKar, Gouri SankarGouri SankarKar2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33171A deep level transient spectroscopy study of hole traps in GexSe1-x-based layers for ovonic threshold switching selectorsProceedings paperhttp://ecst.ecsdl.org/content/92/1/45.abstract