Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETs

Cretu, B.B.CretuSimoen, EddyEddySimoenRoutoure, J.M.J.M.RoutoureCarin, R.R.CarinAoulaiche, MarcMarcAoulaicheClaeys, CorCorClaeys2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25110Static and low frequency noise characterization in standard and rotated UTBOX nMOSFETsProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7063817