Haegeman, BartBartHaegemanTrenkler, ThomasThomasTrenklerEyben, PierrePierreEybenVandervorst, WilfriedWilfriedVandervorstDe Wolf, PeterPeterDe WolfHellemans, L.L.Hellemans2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3482Nanopotentiometry: data interpretation and quantificationProceedings paper