Op de Beeck, JonathanJonathanOp de BeeckFleischmann, ClaudiaClaudiaFleischmannVandervorst, WilfriedWilfriedVandervorstParedis, KristofKristofParedis2021-10-292021-10-2920201932-7447https://imec-publications.be/handle/20.500.12860/35679Nanoscale localisation of an atom probe tip through electric field mappingJournal articlehttps://doi.org/10.1021/acs.jpcc.9b10194