Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS

Michl, J.J.MichlGrill, AlexanderAlexanderGrillStampfer, B.B.StampferWaldhoer, D.D.WaldhoerSchleich, C.C.SchleichKnobloch, T.T.KnoblochIoannidis, E.E.IoannidisEnichlmair, H.H.EnichlmairMinixhofer, R.R.MinixhoferKaczer, BenBenKaczerParvais, BertrandBertrandParvaisGovoreanu, BogdanBogdanGovoreanuRadu, IulianaIulianaRaduGrasser, T.T.GrasserWaltl, M.M.Waltl2022-08-252022-07-092022-08-2520212380-9248WOS:000812325400007https://imec-publications.be/handle/20.500.12860/40100Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOSProceedings paper10.1109/IEDM19574.2021.9720501978-1-6654-2572-8WOS:000812325400007TEMPERATUREDEFECTS