Time dependent variability in RMG-HKMG FinFETs: impact of extraction scheme on stochastic NBTI

Chaudhary, AnkushAnkushChaudharyKaczer, BenBenKaczerRoussel, PhilippePhilippeRousselChiarella, ThomasThomasChiarellaHoriguchi, NaotoNaotoHoriguchiMahapatra, SouvikSouvikMahapatra2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25051Time dependent variability in RMG-HKMG FinFETs: impact of extraction scheme on stochastic NBTIProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7112705