Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs

Hayama, K.K.HayamaTakakura, T.T.TakakuraOhyama, H.H.OhyamaKuboyama, S.S.KuboyamaMatsuda, S.S.MatsudaRafi, J.M.J.M.RafiMercha, AbdelkarimAbdelkarimMerchaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10554Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETsJournal article