Hayama, K.K.HayamaOhyama, H.H.OhyamaMiura, T.T.MiuraPoyai, AmpornAmpornPoyaiSimoen, EddyEddySimoenClaeys, CorCorClaeysKobayashi, K.K.Kobayashi2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5914Radiation damage in shallow trench isolation diodesProceedings paper