Reducing front recombination losses to improve the efficiency of rear junction Cu-plated n-Si cells

Aleman, MonicaMonicaAlemanUruena De Castro, AngelAngelUruena De CastroChoulat, PatrickPatrickChoulatHallam, BrettBrettHallamDang Thi Thuy, ChiChiDang Thi ThuyRussell, RichardRichardRussellDuerinckx, FilipFilipDuerinckxCornagliotti, EmanueleEmanueleCornagliottiSzlufcik, JozefJozefSzlufcik2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23485Reducing front recombination losses to improve the efficiency of rear junction Cu-plated n-Si cellsProceedings paperhttp://www.eupvsec-proceedings.com/proceedings?fulltext=aleman&paper=28014