Impact of radiation on the operation and reliability of deep submicron CMOS technologies

Claeys, CorCorClaeysPut, SofieSofiePutGriffoni, AlessioAlessioGriffoniCester, A.A.CesterGerardin, S.S.GerardinMeneghesso, G.G.MeneghessoPaccagnella, A.A.PaccagnellaSimoen, EddyEddySimoen2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/16888Impact of radiation on the operation and reliability of deep submicron CMOS technologiesProceedings paper