Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs

Wu, LizhouLizhouWuRao, SiddharthSiddharthRaoTaouil, MottaqiallahMottaqiallahTaouilMarinissen, Erik JanErik JanMarinissenKar, Gouri SankarGouri SankarKarHamdioui, SaidSaidHamdioui2022-01-062021-11-022022-01-0620201089-3539WOS:000652599400049https://imec-publications.be/handle/20.500.12860/37919Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMsProceedings paper10.1109/ITC44778.2020.9325258978-1-7281-9113-3WOS:000652599400049