Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory

Michl, JakobJakobMichlGrill, AlexanderAlexanderGrillWaldhoer, DominicDominicWaldhoerGoes, WolfgangWolfgangGoesKaczer, BenBenKaczerLinten, DimitriDimitriLintenParvais, BertrandBertrandParvaisGovoreanu, BogdanBogdanGovoreanuRadu, IulianaIulianaRaduWaltl, MichaelMichaelWaltlGrasser, TiborTiborGrasser2022-06-232021-12-162022-05-302022-06-2320210018-9383WOS:000724501000066https://imec-publications.be/handle/20.500.12860/38619Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: TheoryJournal article10.1109/TED.2021.3116931WOS:000724501000066