Hou, YiYiHouCelano, UmbertoUmbertoCelanoGoux, LudovicLudovicGouxLiu, L.L.LiuDegraeve, RobinRobinDegraeveCheng, Y.Y.ChengKang, J.J.KangJurczak, GosiaGosiaJurczakVandervorst, WilfriedWilfriedVandervorst2021-10-232021-10-2320160003-6951https://imec-publications.be/handle/20.500.12860/26739Multimode resistive switching in nanoscale hafnium oxide stack as studied by atomic force microscopyJournal articlehttp://scitation.aip.org/content/aip/journal/apl/109/2/10.1063/1.4954258