Ludwig, JonathanJonathanLudwigMascaro, MarcoMarcoMascaroCelano, UmbertoUmbertoCelanovan der Heide, PaulPaulvan der HeideVandervorst, WilfriedWilfriedVandervorstParedis, KristofKristofParedis2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33481Advantages of high vacuum for electrical scanning probe microscopyJournal articlehttp://nanoscientific.org/?p=7111