Lukyanchikova, N.N.LukyanchikovaSimoen, EddyEddySimoenMercha, AbdelkarimAbdelkarimMerchaClaeys, CorCorClaeys2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7835Noise and tunnelling through the 2.5 nm gate in SOI MOSFETsOral presentation