Demonstration of silicon-on-insulator mid-infrared spectrometers operating at 3.8μm

Muneeb, MuhammadMuhammadMuneebChen, X.X.ChenVerheyen, PeterPeterVerheyenLepage, GuyGuyLepagePathak, ShibnathShibnathPathakRyckeboer, EvaEvaRyckeboerMalik, Aditya SinghAditya SinghMalikKuyken, BartBartKuykenNedeljkovic, M.M.NedeljkovicVan Campenhout, JorisJorisVan CampenhoutMashanovich, G.Z.G.Z.MashanovichRoelkens, GuntherGuntherRoelkens2021-10-212021-10-212013-041094-4087https://imec-publications.be/handle/20.500.12860/22833Demonstration of silicon-on-insulator mid-infrared spectrometers operating at 3.8μmJournal articlehttp://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-10-11659&origin=search