Zhang, J.F.J.F.ZhangSii, H.K.H.K.SiiChen, A.H.A.H.ChenZhao, C.Z.C.Z.ZhaoUren, M.J.M.J.UrenGroeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeve2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9969Hole trap generation in gate dielectric during substrate hole injectionJournal article