Subhechha, SubhaliSubhaliSubhechhaDegraeve, RobinRobinDegraeveBelmonte, AttilioAttilioBelmonteGoux, LudovicLudovicGouxRoussel, PhilippePhilippeRousselDe Meyer, KristinKristinDe MeyerVan Houdt, JanJanVan HoudtKar, Gouri SankarGouri SankarKar2021-10-262021-10-262018https://imec-publications.be/handle/20.500.12860/31878Understanding endurance in TiN/a-Si/TiOx/TiN RRAM devicesProceedings paperhttps://ieeexplore.ieee.org/document/8388856