'1 Thru +2.5 Reflects': A new technique for de-embedding MIC/MMIC device measurements in fixed-length fixtures

Wang, ConnieConnieWangNauwelaers, BartBartNauwelaersDe Raedt, WalterWalterDe RaedtVan Rossum, MarcMarcVan Rossum2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1647'1 Thru +2.5 Reflects': A new technique for de-embedding MIC/MMIC device measurements in fixed-length fixturesProceedings paper