Rotondaro, AntonioAntonioRotondaroMeuris, MarcMarcMeurisSchmidt, HaraldHaraldSchmidtHeyns, MarcMarcHeynsVandervorst, WilfriedWilfriedVandervorstClaeys, CorCorClaeysHellemans, L.L.HellemansSnauwert, L.L.Snauwert2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/495A semi-quantitative method for studying photoresist strippingProceedings paper