Soft breakdown in ultrathin gate oxides: correlation with the percolation theory of nonlinear conductors

Houssa, MichelMichelHoussaNigam, TanyaTanyaNigamMertens, PaulPaulMertensHeyns, MarcMarcHeyns2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2642Soft breakdown in ultrathin gate oxides: correlation with the percolation theory of nonlinear conductorsJournal article