Xu, ZhenZhenXuPantisano, LuigiLuigiPantisanoKerber, AndreasAndreasKerberDegraeve, RobinRobinDegraeveCartier, EduardEduardCartierDe Gendt, StefanStefanDe GendtHeyns, MarcMarcHeynsGroeseneken, GuidoGuidoGroeseneken2021-10-152021-10-152004-03https://imec-publications.be/handle/20.500.12860/9948A study of relaxation current in high-k gate stacksJournal article