Nardi, F.F.NardiIelmini, D.D.IelminiCagli, C.C.CagliSpiga, S.S.SpigaFanciulli, M.M.FanciulliGoux, LudovicLudovicGouxWouters, DirkDirkWouters2021-10-192021-10-1920110038-1101https://imec-publications.be/handle/20.500.12860/19472Control of filament size and reduction of reset current below 10μA in NiO resistance switching memoriesJournal article