Kaczer, BenBenKaczerDegraeve, RobinRobinDegraeveDe Keersgieter, AnAnDe KeersgieterVan de Mieroop, KoenKoenVan de MieroopSimons, VeerleVeerleSimonsGroeseneken, GuidoGuidoGroeseneken2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6460Consistent model for short-channel NMOSFET after hard gate oxide breakdownJournal article