Study of neutron irradiation effects on SOI and strained SOI MuGFETs assessed by low-frequency noise

Simoen, EddyEddySimoenPut, SofieSofiePutCollaert, NadineNadineCollaertClaeys, CorCorClaeysKilchytska, ValeriaValeriaKilchytskaAlvarado, JoseJoseAlvaradoFlandre, DenisDenisFlandre2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/17992Study of neutron irradiation effects on SOI and strained SOI MuGFETs assessed by low-frequency noiseProceedings paper