Bulk defect induced low-frequency noise in n+-p silicon diodes

Hou, F. C.F. C.HouBosman, GijsGijsBosmanSimoen, EddyEddySimoenVanhellemont, JanJanVanhellemontClaeys, C.C.Claeys2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2640Bulk defect induced low-frequency noise in n+-p silicon diodesJournal article