First-principles-based screening method for resistivity scaling of anisotropic metals

Moors, KristofKristofMoorsSankaran, KiroubanandKiroubanandSankaranPourtois, GeoffreyGeoffreyPourtoisAdelmann, ChristophChristophAdelmann2023-03-232023-01-182023-01-232023-03-232022-12-232475-9953WOS:000906548400002https://imec-publications.be/handle/20.500.12860/40991First-principles-based screening method for resistivity scaling of anisotropic metalsJournal article10.1103/PhysRevMaterials.6.123804WOS:000906548400002POLYCRYSTALLINE FILMSINTERCONNECTSREFLECTIONMODEL