Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents

Martin-Martinez, JavierJavierMartin-MartinezKaczer, BenBenKaczerBoix, J.J.BoixAyala, N.N.AyalaRodriguez, RosanaRosanaRodriguezNafria, MontserratMontserratNafriaAymerich, X.X.AymerichZuber, PaulPaulZuberDierickx, BartBartDierickxGroeseneken, GuidoGuidoGroeseneken2021-10-182021-10-182009-02https://imec-publications.be/handle/20.500.12860/15837Circuit-design oriented modelling of the recovery BTI component and post-BD gate currentsProceedings paper