Nakashima, T.T.NakashimaIdemoto, T.T.IdemotoTsunoda, I.I.TsunodaTakakura, K.K.TakakuraYoneoka, M.M.YoneokaOhyama, H.H.OhyamaYoshino, K.K.YoshinoBargallo Gonzalez, MireiaMireiaBargallo GonzalezSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-202021-10-2020120040-6090https://imec-publications.be/handle/20.500.12860/21189Radiation damage of Si1-xGex S/D p-MOSFETs with different Ge concentrationsJournal article