Kwon, J.J.KwonSharma, A.A.A.A.SharmaChen, C.C.ChenFantini, AndreaAndreaFantiniJurczak, GosiaGosiaJurczakBain, J.J.BainPicard, Y.Y.PicardSkowronski, MarekMarekSkowronski2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/26866Transient thermometry and HRTEM analysis of RRAM thermal dynamics during switching and failureProceedings paperhttps://ieeexplore.ieee.org/document/7574579