Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications

Kilchytska, ValeriyaValeriyaKilchytskaMakovejev, SergejSergejMakovejevNyssens, LucasLucasNyssensHalder, ArkaArkaHalderRaskin, Jean-PierreJean-PierreRaskinFlandre, DenisDenisFlandreKazemi Esfeh, BabakBabakKazemi Esfeh2021-11-252021-11-022021-11-2520212168-6734WOS:000645060300009https://imec-publications.be/handle/20.500.12860/37982Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF ApplicationsJournal article10.1109/JEDS.2021.3057798WOS:000645060300009THRESHOLD VOLTAGE EXTRACTIONSIGNAL OUTPUT CONDUCTANCEULTRA-THIN BODYSOI MOSFETSPARASITIC ELEMENTSFIGURESPERFORMANCEBEHAVIORUTBBTEMPERATURE