Suhane, AmitAmitSuhaneArreghini, AntonioAntonioArreghiniVan den Bosch, GeertGeertVan den BoschBreuil, LaurentLaurentBreuilCacciato, AntonioAntonioCacciatoRothschild, AudeAudeRothschildJurczak, GosiaGosiaJurczakVan Houdt, JanJanVan HoudtDe Meyer, KristinKristinDe Meyer2021-10-182021-10-182009https://imec-publications.be/handle/20.500.12860/16280Experimental evaluation of trapping efficiency in silicon nitride based charge trapping memoriesProceedings paper