At tape-out: can yield in terms of parametric specifications be predicted?

Papanikolaou, AntonisAntonisPapanikolaouMiranda Corbalan, MiguelMiguelMiranda CorbalanMarchal, PolPolMarchalDierickx, BartBartDierickxCatthoor, FranckyFranckyCatthoor2021-10-162021-10-162007-09https://imec-publications.be/handle/20.500.12860/12672At tape-out: can yield in terms of parametric specifications be predicted?Proceedings paper