RTN-based defect tracking technique: experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism

Chai, ZhengZhengChaiMa, JigangJigangMaZhang, WeidongWeidongZhangGovoreanu, BogdanBogdanGovoreanuSimoen, EddyEddySimoenZhang, JiangJiangZhangLi, ZiqhiangZiqhiangLiGao, R.R.GaoGroeseneken, GuidoGuidoGroesenekenJurczak, GosiaGosiaJurczak2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/26413RTN-based defect tracking technique: experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanismProceedings paperhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7573402