Degradation Mechanism of Short Channel p-FinFETs under Hot Carrier Stress and Constant Voltage Stress

Chang, HaoHaoChangZhou, LongdaLongdaZhouYang, HongHongYangJi, ZhigangZhigangJiLiu, QianqianQianqianLiuXu, HaoHaoXuSimoen, EddyEddySimoenYin, HuaxiangHuaxiangYinWang, WenwuWenwuWang2022-01-252021-11-022022-01-2520201946-1550WOS:000635636600049https://imec-publications.be/handle/20.500.12860/37991Degradation Mechanism of Short Channel p-FinFETs under Hot Carrier Stress and Constant Voltage StressProceedings paper*****************WOS:000635636600049