Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulation

Marino, F.A.F.A.MarinoBisi, D.D.BisiMeneghini, M.M.MeneghiniVerzellesi, G.G.VerzellesiZanoni, E.E.ZanoniVan Hove, MarleenMarleenVan HoveYou, ShuzhenShuzhenYouDecoutere, StefaanStefaanDecoutereMarcon, DenisDenisMarconStoffels, SteveSteveStoffelsRonchi, NicoloNicoloRonchiMeneghesso, G.G.Meneghesso2021-10-222021-10-2220150038-1101https://imec-publications.be/handle/20.500.12860/25617Analysis of off-state leakage mechanisms in GaN-based MIS-HEMTs: experimental data and numerical simulationJournal articlehttp://www.sciencedirect.com/science/article/pii/S0038110115001446