Breuil, LaurentLaurentBreuilHaspeslagh, LucLucHaspeslaghBlomme, PieterPieterBlommeLorenzini, MartinoMartinoLorenziniWellekens, DirkDirkWellekensDe Vos, JoeriJoeriDe VosVan Houdt, JanJanVan Houdt2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/8636Reliability investigation of a source side injection local charge trapping deviceOral presentation