Single defect discharge events in vertical-nanowire tunnel-FETs

Fiore, AnonioAnonioFioreFranco, JacopoJacopoFrancoCho, Moon JuMoon JuChoCrupi, FeliceFeliceCrupiStrangio, SebastianoSebastianoStrangioRoussel, PhilippePhilippeRousselRooyackers, RitaRitaRooyackersCollaert, NadineNadineCollaertLinten, DimitriDimitriLinten2021-10-242021-10-2420171530-4388https://imec-publications.be/handle/20.500.12860/28334Single defect discharge events in vertical-nanowire tunnel-FETsJournal articlehttp://ieeexplore.ieee.org/document/7828004/