Dreesen, R.R.DreesenDe Ceuninck, WardWardDe CeuninckDe Schepper, LucLucDe SchepperGroeseneken, GuidoGuidoGroeseneken2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/1871A high resolution method for measuring hot carrier degradation in matched transistor pairsJournal article