Reevaluation of the origin of negative bias stress with and without light exposition in amorphous Indium-Gallium-Zinc-Oxide

de Jamblinne de Meux, AlbertAlbertde Jamblinne de MeuxPourtois, GeoffreyGeoffreyPourtoisGenoe, JanJanGenoeHeremans, PaulPaulHeremans2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/26498Reevaluation of the origin of negative bias stress with and without light exposition in amorphous Indium-Gallium-Zinc-OxideOral presentationhttp://www.european-mrs.com/2016-spring-symposium-n-european-materials-research-society#sthash.zxRaz9Ys.dpuf