Moussa, AlainAlainMoussaBogdanowicz, JanuszJanuszBogdanowiczGroven, BenjaminBenjaminGrovenMorin, PierrePierreMorinBeggiato, MatteoMatteoBeggiatoSaib, MohamedMohamedSaibSantoro, G.G.SantoroAbramovitz, Y.Y.AbramovitzHouchens, K.K.HouchensBen Nissim, S.S.Ben NissimMeir, N.N.MeirHung, J.J.HungUrbanowicz, A.A.UrbanowiczKoret, R.R.KoretTurovets, I.I.TurovetsLee, B.B.LeeLee, W. T.W. T.LeeLorusso, GianGianLorussoCharley, Anne-LaureAnne-LaureCharley2024-03-272024-03-272024-MAR 10021-4922WOS:001182089500001https://imec-publications.be/handle/20.500.12860/43737Wafer-scale characterization for two-dimensional material layersJournal article review10.35848/1347-4065/ad26bcWOS:001182089500001THIN WS2MONOLAYER