SiGeHBT for application in BiCMOS technology. I: Stability, reliability and material parameters

Jain, SureshSureshJainDecoutere, StefaanStefaanDecoutereWillander, M.M.WillanderMaes, HermanHermanMaes2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5362SiGeHBT for application in BiCMOS technology. I: Stability, reliability and material parametersJournal article